The scientific equipement in the labolatory allow to obtain quantitative and qualitative information about physicochemical processes occurring at solid metallic, semiconductor and insulator surfaces as well as on the surfaces of powder and biological materials.
The application of available experimental techniques supports the investigations of materials exhibiting new and unique properties alongside improvement of existing ones.
- ATOMIC FORCE MICROSCOPE (AFM) allows to investigate the surface of semiconductor, metallic, insulator materials and biological samples in the ambient conditions, in a temperature range of -35C to 250C. The scanning head is able to provide information about surface topography and properties such as roughness, friction, adhesion, elasticity, magnetic properties, electrical and thermal conductivity.
- ATOMIC FORCE MICROSCOPE (AFM):
– FastScan head: enables fast scanning in XY-axes up to 35μm and up to 3 µm in Z-axis; operates in a closed feedback loop together with thermally tensometric sensors. Standard modes of operations supported by the device are: Peak Force Tapping / Scan Assist Mode (for air and liquids), Tapping Mode (for air and liquids), Phase Imaging, Contact Mode, Lateral Force Microscopy, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM).
- Dimension Icon XYZ Closed Loop scanning head: enables scanning in XY-axes up to 90 µm and 10 µm in Z-axis, operates in a closed feedback loop together with sensors compensating for thermal drift in X, Y and Z-axes. Standard modes of operations supported by the device are: Tapping and Contact Mode, Lateral Force Microscopy, Phase Imaging, Nanomechanical Mapping, Peak Force QNM, Torsional Resonance, Force Volume, Force Spectroscopy, Surface Potential, Piezo Response, Electrostatic Force Microscopy (EFM), Magnetic Force Microscopy (MFM), Peak Force TUNA, CAFM Conductive AFM, SCM Scanning Capacitance Microscopy.
Autor: PORT - Polski Ośrodek Rozwoju Technologii, Opublikowano: 08.10.2015