The scientific equipement in the labolatory allow to obtain quantitative and qualitative information about physicochemical processes occurring at solid metallic, semiconductor and insulator surfaces as well as on the surfaces of powder and biological materials.
The application of available experimental techniques supports the investigations of materials exhibiting new and unique properties alongside improvement of existing ones.
Creating of surface maps in the nanoscale
Creating of surface maps in the nanoscale considering such properties as: friction, adhesion, elasticity, roughness, electrostatic charge distribution, electric conductivity, magnetic domain structure and thermal conductivity.
Observation of progressing processes
Observation of progressing processes on the examined surface in real time, in the temperature range from -35˚C to 250˚C.
Examining of surface topography
Examining of surface topography (using available operation modes) of semiconductor samples, isolators, metallic and biological in diameter up to 210 mm and height 15 mm.
Testing of biological samples
Testing of biological samples in their natural environment
The Laboratory allows to obtain quantitative and qualitative information concerning processes taking place on surface of metals, semiconductors, isolators and powder and biological materials. In addition, the use of spectroscopic technology (XPS, UPS, AES) enables acquainting with electron properties of the tested surface. The technologies such as (LEED, STM, AFM) allow to obtain information on the surface atomic structure.
Atomic force microscope (AFM)
Scanning head FastScan:
It enables rapid scanning in the range up to 35μm in the XY axis and to ≤ 3μm in the axe Z, it works in a closed loop of loopback and features thermally compensated tensometric sensors. As a standard it serves the following operation modes: Peak Force Tapping / Scan Asyst (in the air or in liquids), Tapping Mode (in the air or in liquids), Phase Imaging, Contact Mode, Lateral Force Microscopy, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM).
Scanning head Dimension Icon XYZ Closed-Loop:
It enables scanning in the range to 90 μm in the axis XY and to ≤ 10μm in the axe Z, it operates in the closed-loop mode with sensors compensating thermal drift in the axis X, Y and Z. As a standard the head serves the following operating modes: TappingMoge, Contact Mode, Lateral Force Microscopy, Phase Imaging, Nanomechanical Mapping, Peak Force QNM, Torsional Resonance, Force Volume, Force Spectroscopy, Surface Potential, Piezo Response, Electrostatic Force Microscopy (EFM), Magnetic Force Microscopy (MFM), Peak Force TUNA, CAFM – Conductive.
The ultra High-vacuum system comprises chambers: analytical, preparatory, tunnel microscope scanning, high pressure reactor. The pressure inside of the chambers is 5•10-11Torr. Measurements can be performed from helium temperatures to over 2300C.
The analytical chamber is provided with a hemispheric analyser VG SCIENTA with a monochromator, it allows for performing testing of surface electron structure using technologies (XPS, AES, UPS, ARPES). In addition, an ion cannon enables obtaining information for the interior of the tested sample.
Analytical chamber, The Solid Body Structure Laboratory
The preparatory chamber enables preparing of samples and depositing of conductive and non-conductive films in a wide range of temperatures with a possibility of surface modification in gas atmosphere.
Preparatory chamber, The Solid Body Structure Laboratory
TUNNEL MICROSCOPE SCANNING CHAMBER
The tunnel microscope scanning chamber allows for testing the atomic and electron structure and the properties such as friction, adhesion, elasticity, roughness as well as the magnetic domain structure of surface films.
HIGH PRESSURE REACTOR CHAMBER
The high-pressure reactor chamber enables obtaining information concerning physicochemical processes occurring on the tested surfaces in the gas atmosphere in a wide range of pressure.
Rafał Szukiewicz PhD. – Laboratory Manager, Physicist
Maciej Kuchowicz, PhD – Physicist, Solid Works
Marcin Wiejak, PhD – Physicist, LabView
Autor: PORT - Polski Ośrodek Rozwoju Technologii, Opublikowano: 08.10.2015